CIESC Journal ›› 2011, Vol. 19 ›› Issue (1): 1-9.

• •    下一篇

Effect of Boundary Layers on Polycrystalline Silicon Chemical Vapor Deposition in a Trichlorosilane and Hydrogen System

张攀1, 王伟文2, 陈光辉2, 李建隆2   

  1. 1. Institute of Electronmechanical Engineering, Qingdao University of Science and Technology, Qingdao 266061, China;
    2. Institute of Chemical Engineering, Qingdao University of Science and Technology, Qingdao 266042, China
  • 收稿日期:2010-06-11 修回日期:2010-11-16 出版日期:2011-02-28 发布日期:2011-02-28
  • 通讯作者: LI Jianlong, E-mail: jlong_li@hotmail.com
  • 基金资助:
    Supported by the Natural Science Foundation of Shandong Province of China (ZR2009BM011);the Doctor Foundation of Shandong Province of China (BS2010NJ005)

Effect of Boundary Layers on Polycrystalline Silicon Chemical Vapor Deposition in a Trichlorosilane and Hydrogen System

ZHANG Pan1, WANG Weiwen2, CHENG Guanghui2, LI Jianlong2   

  1. 1. Institute of Electronmechanical Engineering, Qingdao University of Science and Technology, Qingdao 266061, China;
    2. Institute of Chemical Engineering, Qingdao University of Science and Technology, Qingdao 266042, China
  • Received:2010-06-11 Revised:2010-11-16 Online:2011-02-28 Published:2011-02-28
  • Supported by:
    Supported by the Natural Science Foundation of Shandong Province of China (ZR2009BM011);the Doctor Foundation of Shandong Province of China (BS2010NJ005)

摘要: This paper presents the numerical investigation of the effects of momentum, thermal and species boundary layers on the characteristics of polycrystalline silicon deposition by comparing the deposition rates in three chemical vapor deposition (CVD) reactors. A two-dimensional model for the gas flow, heat transfer, and mass transfer was coupled to the gas-phase reaction and surface reaction mechanism for the deposition of polycrystalline silicon from trichlorosilane (TCS)-hydrogen system. The model was verified by comparing the simulated growth rate with the experimental and numerical data in the open literature. Computed results in the reactors indicate that the deposition characteristics are closely related to the momentum, thermal and mass boundary layer thickness. To yield higher deposition rate, there should be higher concentration of TCS gas on the substrate, and there should also be thinner boundary layer of HCl gas so that HCl gas could be pushed away from the surface of the substrate immediately.

关键词: boundary layer, polycrystalline silicon, numerical simulation, mass diffusion

Abstract: This paper presents the numerical investigation of the effects of momentum, thermal and species boundary layers on the characteristics of polycrystalline silicon deposition by comparing the deposition rates in three chemical vapor deposition (CVD) reactors. A two-dimensional model for the gas flow, heat transfer, and mass transfer was coupled to the gas-phase reaction and surface reaction mechanism for the deposition of polycrystalline silicon from trichlorosilane (TCS)-hydrogen system. The model was verified by comparing the simulated growth rate with the experimental and numerical data in the open literature. Computed results in the reactors indicate that the deposition characteristics are closely related to the momentum, thermal and mass boundary layer thickness. To yield higher deposition rate, there should be higher concentration of TCS gas on the substrate, and there should also be thinner boundary layer of HCl gas so that HCl gas could be pushed away from the surface of the substrate immediately.

Key words: boundary layer, polycrystalline silicon, numerical simulation, mass diffusion