CIESC Journal ›› 2024, Vol. 75 ›› Issue (1): 83-94.DOI: 10.11949/0438-1157.20230668
• Reviews and monographs • Previous Articles Next Articles
Kexin YAN1(), Hongtao JIANG2, Weiqun GAO1, Xiaohui GUO2, Weizhen SUN1(), Ling ZHAO1
Received:
2023-07-03
Revised:
2023-09-04
Online:
2024-03-11
Published:
2024-01-25
Contact:
Weizhen SUN
闫可欣1(), 姜洪涛2, 高维群1, 郭晓晖2, 孙伟振1(), 赵玲1
通讯作者:
孙伟振
作者简介:
闫可欣(2001—),女,硕士研究生,yankxin123@163.com
基金资助:
CLC Number:
Kexin YAN, Hongtao JIANG, Weiqun GAO, Xiaohui GUO, Weizhen SUN, Ling ZHAO. Recent advances in the removal of trace boron and phosphorus impurities from electronic grade silicon raw materials[J]. CIESC Journal, 2024, 75(1): 83-94.
闫可欣, 姜洪涛, 高维群, 郭晓晖, 孙伟振, 赵玲. 电子级多晶硅原料中痕量硼磷杂质的脱除研究进展[J]. 化工学报, 2024, 75(1): 83-94.
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